New microscopy concept enters into force
Date Time New microscopy concept enters into force The first demonstration of an approach that inverts the standard paradigm of scanning probe microscopy raises the prospect of force sensing at the fundamental limit. Configuration of the inverted scanning force microscope. (Graphics: Alexander Eichler, ETH Zurich) The development of scanning probe microscopes in the early 1980s brought a breakthrough in imaging, throwing open a window into the world at the nanoscale. The key idea is to scan an extremely sharp tip over a substrate and to record at each location the strength of the interaction ...
Source: miragenews.com