NEW: H5620 high-productivity memory tester that integrates burn-in and memory-cell test functions in one system
NEW: TS9001 terahertz analysis system for measuring IC mold thickness and the wiring quality of IC packages and printed circuit boards
Highly flexible T5830ES engineering station, whose Tester-per-Site™ design enables it to conduct testing across a wide range of flash memory devices
T5503HS2 test system for ultra-high-speed memory ICs including next-generation LP-DDR5 and DDR5 devices
B6700 product family of burn-in memory testers
MPT3000 series test system that combines thermal-control capability with high throughput, enabling extreme thermal testing of solid-state drives (SSDs) including PCIe Gen 4
Advantest to Exhibit Latest IC Test Solutions Advancing Technology Convergence at SEMICON China 2021 leaderpost.com - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from leaderpost.com Daily Mail and Mail on Sunday newspapers.