Atomic Force Microscopy-based Nanoindentation: An Overview

AFM nanoindentation has application in surface height topology mapping and 3D high-resolution imaging, notably in facilitating in situ quantification of the residual indents’ shape.

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Gorodenkoff Shutterstock ,Parva Chhantyal ,Beilsteinj Nanotechnol ,Atomic Force Microscopy ,Nanoindentation To Quantify Mechanical Properties Of Nano ,Journal Of Materials Research ,Young ,Force Microscopy ,Veeco Dimension ,Measurement Science ,Metal Organic Framework ,Vibrational Modes ,Terahertz Physical Phenomena Underpinning ,Micron Sized Crystals ,Organic Framework ,Nanoindentation ,Fm ,Indentation ,