Surface Topography Imaging with AFM

The surface topography of a material provides information on its mechanical and chemical characteristics, which are crucial in determining its applicability. Atomic force microscopy (AFM) is a robust analytical technique often employed to study the surface topography of the majority of materials. This article provides an overview of AFM and its application in surface-topography imaging.

Related Keywords

Bhavna Kavetisep ,Bhavna Kaveti ,Melo Simas ,Atomic Force Microscopy Study ,Atomic Force Microscopy ,Electronic Properties ,Surface Topography Imaging ,Surface Topography ,Industry Focus ,Electromechanical Transducers ,Analytical Letters ,Force Microscopy ,Main Components ,Bovine Serum Albumin ,Biomedical Alloy ,Mott Schottky Analysis ,Gutta Percha Surface ,Initial Adhesion In Vitro ,Maging With Afm ,