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Atomic Force Microscopy Enhances The Nanoscopy Toolkit

Atomic Force Microscopy Enhances The Nanoscopy Toolkit By James F. MacKay, Ph.D., Mad City Labs Inc. Atomic force microscopes are ideal for nanomechanical characterization, bringing utility to nanoscopy applications and excelling in conditions where low light presents challenges or sample integrity is vital. Signing up provides unlimited access to: Trend and Leadership Articles Not yet a member of Photonics Online? Register today. Email Login Information Photonics Component Mfg. Engineering/Technical Management COOK ISLANDS HONDURAS KOREA, REPUBLIC OF LATVIA MADAGASCAR SAMOA SPAIN URUGUAY Continue Subscriptions Sign up for the newsletter that brings you the industry s latest news, technologies, trends and products.

01 06 21 -- Build A DIY AFM | Validating Aerospace Thermal Protection

01.06.21 Build A DIY AFM | Validating Aerospace Thermal Protection   Article | By James F. MacKay, Mad City Labs, Inc. Atomic force microscopes (AFMs) are versatile tools for characterizing surfaces down to the sub-nanometer scale. Researchers can build their own AFMs for as little as $30,000 using off-the-shelf components such as nanopositioning stages. White Paper | By John McCauley, Ophir Photonics Additive manufacturing allows for more customized parts using more specialized materials, and will eventually create a more localized, rapid, and agile distribution network. This white paper discusses important laser performance characteristics, how to measure them, and how to keep the laser in spec.

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