Nanoscale Characterization of Polymer Thin Films with AFM
One of the versatile analytical tools used for the nanoscale characterization of polymeric materials has been atomic force microscopy (AFM).
Priyom Bose Egorov Artem Shutterstock Digital Pulsed Force Mode Polymer Thin Films Polymer Thin Films Using Atomic Force Infrared Spectroscopy
Source: azonano.com