Microstructure and Dielectric Properties of Cr-Doped MoO3 Microrods
Researchers have used scanning electron microscopy (SEM), an impedance analyzer of 1 MHz - 3 GHz, energy dispersive spectroscopy (EDS), and X-ray diffraction (XRD) to investigate the microstructure and optical and dielectric properties of synthesized Cr-doped MoO3 samples.
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Source: azooptics.com