How to Characterize Ferroelectric Materials
Studying ferroelectric materials can be done with the help of piezoresponse force microscopy (PFM), due to the sensitivity and nanometer-level resolution it inherits from AFM. Bruker discusses the best modes and practices in regards to PFM measurements in a new application note.
Louis Castel Bruker Nano Surfacesmar Piezoresponse Force Microscopy Vector Piezoresponse Force Microscopy Bruker Nano Force Microscopy
Source: azom.com