Nanotechnology Now - Press Release: Focused ion beam technology: A single tool for a wide range of applications
nanotech-now.com - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from nanotech-now.com Daily Mail and Mail on Sunday newspapers.
Focused ion beam technology: A single tool for a wide range of applications
phys.org - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from phys.org Daily Mail and Mail on Sunday newspapers.
E-Mail
IMAGE: The silicate framework of a diatom does not conduct electricity. For a scanning electron microscope image it would therefore have to be coated, which can result in details of the. view more
Credit: HZDR
A finely focused ion beam (FIB) is a very useful tool in nanotechnology and analytics. Until now, scientists have mainly used FIB technology to prepare samples for certain microscopic techniques, such as troubleshooting in the semiconductor industry. But FIBs can do much more. The EU funded COST network project Focused Ion Technology for Nanomaterials - FIT4NANO , initiated by the Helmholtz-Zentrum Dresden-Rossendorf (HZDR), aims to bring together researchers and companies from all over Europe to jointly develop the technology and open up new applications.