Applications of Spectroscopic Ellipsometry in Surface Science
This article outlines an innovative approach to overcome technical obstacles and achieve accurate, non-destructive measurements of thickness and refractive index for liquid surfaces using an advanced SE-2000 spectroscopic ellipsometer.
Maria Osipova Semilab Semiconductor Physics Laboratory Semilab Semiconductor Physics Laboratoryaug Semilab Semiconductor Physics Image Credit Science Direct Volume
Source: azom.com