Electron Microscopy Testing of Semiconductors
Semiconductor technology is inherently small, traditional mechanical test methods are not suitable to assess mechanical properties of individual components. Here, scanning electron microscopy (SEM) based micromechanical characterization techniques offer two considerable advantages.
Maria Osipova Alemnis Agaug Alemnis Standard Assembly Micromechanical Testing For Semiconductor Materials Image Credit Integrated Devices
Source: azonano.com