Page 2 - Materials Characterization News Today

In this interview, AZoM speaks with Petr Klímek, Product Marketing Director for TESCAN, about the TESCAN CLARA, a field-free analytical UHR SEM for nanoscale materials characterization.

Lines of shifted atoms, or dislocations, in electronic materials have long been considered detrimental due to their tendency to impede the flow of electricity. But a new $7.5 million project led by the University of Michigan will instead embrace these imperfections in next-generation electronic dev

The Verder Group announces the acquisition of Formulaction S.A. of France. As part of the group’s Scientific Division Formulaction will be integrated into Microtrac MRB, a leading manufacturer of ...

A team at the University of Michigan has now reduced the thickness of ferroelectric semiconductors to only 5 nm, or around 50 atoms, making them suitable for bridging current computers with future devices.

Guangzhou, capital of Guangdong province, has won the right to host the 2026 International Conference on Secondary Ion Mass Spectrometry (SIMS), according to a statement released by the Hong Kong University of Science and Technology (Guangzhou) on Friday.

Although nanotechnology and materials science are complicated topics for most of us, the research in these fields is of great importance to almost everyone. Your digital gadgets, for example, are completely dependent on it.

Although nanotechnology and materials science are complicated topics for most of us, the research in these fields is of great importance to almost everyone. Your digital gadgets, for example, are completely dependent on it.

New research on semiconductors using microscopes that provide 3-D models at an atomic level could one day have an impact on your electronic gadgets.

Improve your lithium-ion batteries with the help of material characterization. Learn how to extend the lifespan and increase the energy density of your batteries, while also optimizing power output and maintaining safety standards. Ensuring batteries are safe, powerful, and reliable is more critical

In this article, Kratos Analytical details the value of X-ray photoelectron spectroscopy for materials characterization.