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Council call for cash comes in support of climate change action and Nest Lab

Just where the municipal money is in relation to the mouth on climate change action will be known once the next round of Nelson city budget discussions begin later this year. Several councillors recently called for immediate financial support of Nest Lab the city’s social innovation lab for climate solutions at the conclusion of a presentation by Natalie Douglas, the

Marcus Hunter-Neill: I ve got nice high ceilings for skipping in my living room

Marcus Hunter-Neill: I ve got nice high ceilings for skipping in my living room
irishnews.com - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from irishnews.com Daily Mail and Mail on Sunday newspapers.

Sponsored Content: Packetize test data for no-compromise DFT

Sponsored Content: Packetize test data for no-compromise DFT Bus-based scan data distribution architecture enables true bottom-up DFT flows, writes Geir Eide of Siemens Digital Industries Software. The dramatic rise in manufacturing test time for today’s large and complex SoCs is rooted in the use of traditional approaches to moving scan test data from chip-level pins to core-level scan channels. The pin-multiplexing (mux) approach works fine for smaller designs but can become problematic with an increase in the number of cores and the design complexity on today’s SoCs. The next revolution in DFT tools to take test time, test cost, and DFT implementation effort eliminates the challenges of pin-mux approach by decoupling the core-level DFT requirements from the chip-level test delivery resources.

Sponsored Content: Packetize test data for no-compromise DFT

Sponsored Content: Packetize test data for no-compromise DFT Bus-based scan data distribution architecture enables true bottom-up DFT flows, writes Geir Eide of Siemens Digital Industries Software. The dramatic rise in manufacturing test time for today’s large and complex SoCs is rooted in the use of traditional approaches to moving scan test data from chip-level pins to core-level scan channels. The pin-multiplexing (mux) approach works fine for smaller designs but can become problematic with an increase in the number of cores and the design complexity on today’s SoCs. The next revolution in DFT tools to take test time, test cost, and DFT implementation effort eliminates the challenges of pin-mux approach by decoupling the core-level DFT requirements from the chip-level test delivery resources.

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