Sensitive Instrument News Today

Posted 5 hours ago Xiaoli Tan and a team of campus collaborators used this transmission electron microscope at the Ames Laboratorys Sensitive Instrument Facility to study the effects of engineering defects into certain materials. Larger photo. Photo by Christopher Gannon. AMES, Iowa – Materials engineers don’t like to see line defects in functional materials. The structural flaws along a one-dimensional line of atoms generally degrades performance of electrical materials. So, as a rese...

Date Time Engineered defects in crystalline material boosts electrical performance Xiaoli Tan and a team of campus collaborators used this transmission electron microscope at the Ames Laboratory’s Sensitive Instrument Facility to study the effects of engineering defects into certain materials. Larger photo. Photo by Christopher Gannon. AMES, Iowa – Materials engineers don’t like to see line defects in functional materials. The structural flaws along a one-dimensional line of atoms gene...