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Hprobe Announces New Generation of Magnetic Test Head for Wafer Sort of MRAM in Mass Production

Grenoble, France, November 30, 2021 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced a breakthrough magnetic test head revolutionizing MRAM Wafer Sort (WS). The new module, the H3DM-XL, is at the heart of the latest addition to Hprobe’s IBEX line, the IBEX-WS. The IBEX-WS test equipment integrates 3D magnetic field…
San Francisco United States Siamak Salimy Magnetics Society Automatic Test Equipment Field Calibration Unit

Hprobe Receives Order from a Tier-1 Semiconductor Manufacturer for a Wafer-Level Magnetic Tester to be Used for Strategic R&D of Magnetic Materials and Devices

(0) Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced a significant order from a tier-1 semiconductor manufacturer for a wafer-level magnetic tester. The equipment will be used for research and development of magnetic materials and devices, which represents a very promising technology for MRAM chips and magnetic sensors. With this announcement, Hprobes IBEX tester is clearly recognized as an essential solution for the industry. Wit...
Kostenloser Wertpapierhandel Camille Dufour Laurent Lebrun International Pr Consulting Automatic Test Equipment Spin Transfer Torque

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