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Physicists at The University of Texas at Arlington have developed a new technique that can measure the properties of the topmost atomic layer of materials without including information from the un ...

Physicists at The University of Texas at Arlington have developed a new technique that can measure the properties of the topmost atomic layer of materials without including information from the underlying layers.

Researchers at The University of Texas at Arlington have created a brand-new method for measuring the properties of the topmost atomic layer of materials without taking into account data from the deeper layers.

Researchers have demonstrated a way of measuring the electronic states of a material’s surface while avoiding signal contaminations from deeper layers.