Oxford Instruments Asylum Research releases fast force mapping (FFM) nanomechanical mode on Jupiter XR, large sample atomic force microscope
Product News: Oxford Instruments Asylum Research releases fast force mapping (FFM) nanomechanical mode on Jupiter XR, large sample atomic force microscope
07 May 2021
Oxford Instruments Asylum Research is pleased to announce the release of fast force mapping (FFM) mode for the Jupiter XR atomic force microscope (AFM). The FFM mode enables users to image sample topography and simultaneously acquire nanomechanical information such as elasticity, adhesion, and hardness. Additionally, when used in conjunction with the conductive AFM probe holder, sample conductivity can also be characterized.
Massachusetts Institute of Technology
MIT.nano has announced that Oxford Instruments Asylum Research, a company that manufactures and supplies atomic force microscopy (AFM) instruments for academic research and industrial R&D, has joined the MIT.nano Consortium.
Asylum Research, one of seven businesses comprising the Oxford Instruments Group, designs tools for characterizing samples from both materials and bioscience research. In addition to imaging, their equipment has quantitative measurement capabilities for nanoelectrical, nanomechanical, and electromechanical characterization.
“We are excited to welcome Oxford Instruments Asylum Research to the MIT.nano Consortium,” says Vladimir Bulović, the founding faculty director of MIT.nano and the Fariborz Maseeh (1990) Professor of Emerging Technology. “Their technical expertise and cutting-edge atomic force microscopy instruments will propel the impact of MIT’s discoveries and open the door to new nanoscale horizons in our f