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Light, which can be seen by the human eye has a much longer wavelength compared to electrons. In fact, objects can be magnified up to an unrivaled 200,000x using an electron beam with outstanding degrees of chemical specificity.
Transmission electron microscopy (TEM) and scanning electron microscopy (SEM) are the two main types of EM. While each technique employs the same fundamental apparatus to yield a focused electron beam that is directed onto the object of interest, they differ in how the samples are illuminated.
A TEM utilizes a fluorescent screen to produce a projection image while an SEM employs a range of deflector coils to modify the beam path and raster scan the sample. A continuous wave (CW) electron beam is predominantly used in each of these systems which fails to deliver appropriate temporal information.