EW: In conversation with Siemens: SSN and next-gen design-fo

EW: In conversation with Siemens: SSN and next-gen design-for-test technology

Lee Harrison, Director of Product Marketing for Siemens EDA, talks about Streaming Scan Network (SSN) buses and the next-generation of design-for-test technology. He discusses the significant changes involved with SSN, de-coupling complexity and dependencies, and delivering test-pattern content in a packetised format...

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