"Micro-displacement and Profile Measurement Using a Selfmixi

"Micro-displacement and Profile Measurement Using a Selfmixing Interfer" by Han Wang


Abstract
Self-mixing interferometry (SMI) is a promising non-contact sensing technology, which has attracted much research attention in the last few decades. The SMI effect takes place when a small portion of laser is back-scattered from an external target and re-enters the laser diode (LD) internal cavity. A typical sensing system using an SMI configuration consists of an LD as the laser source, a target to reflect the laser, a photo diode (PD) to capture the optical signal. This configuration indicates the SMI-based sensing technology’s merits of minimum part-count scheme, low cost in implementation and ease in optical alignment. Various SMI-based sensing applications have been reported, including the measurement of displacement, velocity, vibration, laser related parameters, thickness, mechanical resonance, imaging, material parameter measurement, near-field microscopy, chaotic radar, acoustic detection, biomedical applications, etc.

Related Keywords

, Fast Fourier Transform , Self Mixing Interferometry , Semiconductor Laser Diode , Micro Displacement Sensing , Profile Measurement , Time Frequency Analysis , குறைக்கடத்தி லேசர் டையோடு , ப்ரொஃபைல் அளவீட்டு , நேரம் அதிர்வெண் பகுப்பாய்வு ,

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