Inspection Technology Incorporates AI to Detect Defects in R

Researchers at the Fraunhofer Institute for Material and Beam Technology IWS (Fraunhofer IWS) have developed a solution that uses AI and optical measu

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Christopher Taudt , Ebeam Technology , Fraunhofer Institute For Material , Fraunhofer Application Center , Fraunhofer Institute , Optical Metrology , Surface Technologies , Research Amp Technology , Optics , Inspection , Metrology , Manufacturing , Roll To , Quality Control , Defect , Detection , Sensors Amp Detectors ,