Intrinsic electrical characterization of two-dimensional tra

Intrinsic electrical characterization of two-dimensional transition metal dichalcogenides via scanning probe microscopy


15 July 2021
Suitable techniques to characterize the intrinsic physical and electrical properties of as-deposited 2D materials, are a key link between the quality of as-deposited 2D materials and the performance of 2D materials-based electronic devices. In this application note, Park Systems investigates the intrinsic electrical properties of as-deposited 2D TMDs, utilizing scanning probe microscopy (SPM). 
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, Application Note , Spark Systems , விண்ணப்பம் குறிப்பு , பூங்கா அமைப்புகள் ,

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