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Rutherford Backscattering Spectrometry for Thin Film Analysi
Rutherford Backscattering Spectrometry for Thin Film Analysi
Rutherford Backscattering Spectrometry for Thin Film Analysis
The construction of compact semiconductors with reduced thickness and size is desirable for their application in microelectronic devices and transistors.
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Andrewr Barron ,
Rutherford Backscattering ,
Bhavna Kaveti ,
Symposium On Nuclear Physics ,
Rice University ,
Physical Chemistry ,
Condensed Matter ,
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Thin Films ,
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