Secondary Ion Mass Spectrometry and FIB-SEM Combine : vimars

Secondary Ion Mass Spectrometry and FIB-SEM Combine

A magnetic sector secondary ion mass spectrometry was integrated with a focused ion beam (FIB)–scanning electron microscopy (SEM) instruments for nanoscale investigations.

Related Keywords

Bhavna Kavetijul , Susha Cheriyedath , Fox Shutterstock , Bhavna Kaveti , , Ion Mass Spectrometry , Focused Ion , Magnetic Sector Secondary Ion Mass Spectrometry , Nanoscale Chemical , Image Credit , Analytical Chemistry ,

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