The NanoSpace UHV FIB-SEM from TESCAN is a versatile, easy-to-use system specifically designed to function under ultra-high vacuum (UHV) conditions. Users can configure the NanoSpace system either as a scanning electron microscope (SEM) or as a dual-beam platform that incorporates an SEM and a high performance focused ion beam (FIB). Featuring a modular design, the UHV system allows an array of SEM and FIB columns that match the specific goals and needs of end-users. The system also offers a comprehensive, optimal and customized solution for surface analysis and for FIB nano-machining on samples that need the most rigorous contamination-free environment.