Using Thermal Desorption Spectroscopy to Analyze Thin Films

Traditionally, spectroscopy methods such as Infrared spectroscopy (IRS) and Raman spectrometry are preferred for the analysis of thin films, but recently, thin film desorption spectroscopy has been the center of attention.

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Ibtisam Abbasidec , Laureen Vereecke , S Singha Shutterstock , Ibtisam Abbasi , Matty Maex , Christiane Gallagher , D Van Elshocht , International Society For Optical Engineering , Characterization Of Advanced Semiconductor Materials , Energy Storage Technologies Industry , Semiconductor Thin Films , Energy Storage Technologies , Desorption Spectroscopy , Thin Films , Storage Technologies , Storage Technologies Industry Focus , Thermal Desorption Spectroscopy , Preferred Choice , Organic Thin Films , Surface Science , Van Elshocht , Advanced Semiconductor Materials , Thermal Desorption Mass Spectrometry , Atmospheric Pressure , International Society , Pectroscopy Of Thin Films ,