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Oxford Instruments Asylum Research today announces the release of new features for the Jupiter XR atomic force microscope (AFM) to increase productivity and improve usability.
This article explores the significant advancements in transistor technology through the integration of silicon-doped hafnium oxide, highlighting its role in improving energy efficiency and performance in modern computing devices.
This article explores the pioneering work of Dr. Laura Fumagalli and her team in using advanced Scanning Dielectric Microscopy to investigate the electric polarization properties of nanomaterials like 2D crystals and biomolecules.
Oxford Instruments Asylum Research announces the release of the HVA150 – high voltage accessory for the Jupiter XR atomic force microscope (AFM).
Oxford Instruments Asylum Research today announces the release of its new atomic force microscope (AFM) package developed for battery research, the Cypher ES Battery Edition.