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Using OIM Analysis for Correlative Microscopy

Published: February 9, 2023

This article looks at how OIM analysis can be used for correlative microscopy.

Source: azom.com

Related Topics:

Energy Dispersive SpectroscopyBackscatter DiffractionScanning Electron MicroscopeWavelength Dispersive SpectrometryGatan Monarc ProSecondary ElectronQuadratic BivariateImage CreditInverse Pole FigureOim AnalysisCorrelative Microscopy

Low-Dose Electron Backscatter Diffraction Analysis

Published: February 7, 2023

The Clarity™ EBSD Detector, the world’s first commercially available direct electron detector for EBSD applications, enables true low-dose EBSD to allow for the characterization of these crystalline materials.

Source: azom.com

Related Topics:

Atrina PectinataJulian Steele Ku LeuvenBackscatter DiffractionImage CreditInverse Pole FigureImage QualityJulian SteeleDirect Electron DetectorLow Dose Electron Backscatter Diffraction AnalysisLectron Backscatter Diffraction Analysis