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AFM Analysis of Polymer Composites after Gas Cluster Etching

Published: June 29, 2022

A study published in Applied Surface Science focuses on the preparation of lightweight composite structures for nanoindentation and nano-chemical analyzation using gas cluster ion beam (GCIB) etching.

Source: azom.com

Related Topics:

Research FindingsAtomic Force MicroscopyApplied Surface ScienceSurface Preparation TechniqueCluster Ion Beam MethodTraditional Monoatomic Ion Guns