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An SPIP™ User's Perspective on the Transition to MountainsSPIP® for AFM Analysis Sponsored by Digital SurfJan 21 2021 Following the end of SPIP™ support and maintenance last December, the founder of SurfaceChar LLC and longtime SPIP™ user, Dr. Dalia Yablon, reports on her experience when adopting MountainsSPIP ® for AFM image analysis and processing. Image Credit: Digital Surf  "I have been an SPIP™ Image Metrology user since 2003 and quickly became a fan for all of its capabilities including more advanced functionality like particle analysis and force curves that ...

Image Credit: Digital Surf Nanoparticles find their use in numerous everyday commercial products, including cosmetics, foods and pharmaceuticals. Their characterization at the nanometer scale requires  very particular capabilities . For this specific application, a team of researchers at the LNE Nanotech Institute (France) synthesized measurements from multiple instrument techniques, including Scanning Electron Microscopy (SEM) equipped with a next-generation energy dispersive X-ray detector (EDX) and Atomic Force Microscopy (AFM) . Advanced processing software was necessary in order to c...