Nanoparticle Analysis - Correlating EDX, AFM and SEM Data
Image Credit: Digital Surf Nanoparticles find their use in numerous everyday commercial products, including cosmetics, foods and pharmaceuticals. Their characterization at the nanometer scale requires very particular capabilities . For this specific application, a team of researchers at the LNE Nanotech Institute (France) synthesized measurements from multiple instrument techniques, including Scanning Electron Microscopy (SEM) equipped with a next-generation energy dispersive X-ray detector (EDX) and Atomic Force Microscopy (AFM) . Advanced processing software was necessary in order to c...
Source: azonano.com