Gpixel and Tower Semiconductor develop iToF sensor
Gpixel and Tower Semiconductor develop iToF sensor Gpixel and Tower Semiconductor have announced that Gpixelâs indirect Time of Flight (iToF) sensor for 3D imaging, the GTOF0503, is being produced utilising Tower's 65nm leading pixel-level stacked BSI CIS technology at its Uozo, Japan facility. The sensor features a 5um 3-tap state-of-the-art iToF pixel incorporating a pixel array with a resolution of 640 x 480 pixels, and is targeting a broad range of fast-growing depth sensing and distance measurement applications in markets such as vision-guided robotics, bin ...
Source: newelectronics.co.uk