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Atomic force microscopy (AFM) has been leveraged to study the surface defects of natural rubber vulcanizates so that their structural-mechanical properties can be defined. This data is vital to improving the quality of rubber products.
Pioneers in Optics: Ernst Ruska (1906–1988) - Volume 30 Issue 2
FluidFM combines AFM to enable force-sensitive nanopipette experiments under aqueous conditions.
Atomic force microscopy (AFM) is a powerful microscopy technique. It is used to acquire high-resolution images at the nanoscale to better understand the properties of matter.
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