Piezoelectric Feedback Boosts Infrared Atomic Force Microscopy
Image Credit: Elizaveta Galitckaia/Shutterstock.com Scientists at the Beckman Institute for Advanced Science and Technology at the University of Illinois have suggested a new approach to improve AFM-IR measurements' sensitivity. This method, proposed by Rohit Bhargava and his colleagues, is based on a closed-loop feedback system using piezoelectric material and offers responsivity-corrected AFM-IR imaging. Nanoscale materials have extensive applications in various fields, ranging from nanoelectronics and photonics to everyday devices such as sensors and batteries. To fully explore and develo...
Source: azooptics.com