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Picarro Cavity Ring-Down Spectroscopy Successfully Validated Under EPA's OTM-47 to Measure Ethylene Oxide Emissions in Real-Time from Stationary Sources - Vimarsana News

Picarro Cavity Ring-Down Spectroscopy Successfully Validated Under EPA's OTM-47 to Measure Ethylene Oxide Emissions in Real-Time from Stationary Sources

SANTA CLARA, Calif., April 5, 2023 /PRNewswire/ -- Picarro, Inc. today announced the successful validation and use of the company's Cavity Ring-Down Spectroscopy (CRDS) under Other Test Method 47 (OTM-47) as published by the Environmental Protection Agency (EPA) on March 23, 2023. The method describes the measurement of ethylene oxide (EtO or EO) emissions from stationary sources by CRDS....

Picarro, Inc.: Picarro Cavity Ring-Down Spectroscopy Successfully Validated Under EPA's OTM-47 to Measure Ethylene Oxide Emissions in Real-Time from Stationary Sources - Vimarsana News

Picarro, Inc.: Picarro Cavity Ring-Down Spectroscopy Successfully Validated Under EPA's OTM-47 to Measure Ethylene Oxide Emissions in Real-Time from Stationary Sources

SANTA CLARA, Calif., April 4, 2023 /PRNewswire/ -- Picarro, Inc. today announced the successful validation and use of the company's Cavity Ring-Down Spectroscopy (CRDS) under Other Test Method

Picarro Cavity Ring-Down Spectroscopy Successfully Validated Under EPA's OTM-47 to Measure Ethylene Oxide Emissions in Real-Time from Stationary Sources - Vimarsana News

Picarro Cavity Ring-Down Spectroscopy Successfully Validated Under EPA's OTM-47 to Measure Ethylene Oxide Emissions in Real-Time from Stationary Sources

/PRNewswire/ -- Picarro, Inc. today announced the successful validation and use of the company's Cavity Ring-Down Spectroscopy (CRDS) under Other Test Method...

Picarro's New 1-ppb Class Chemical Metrology Solution for Lithography Process Tool Monitoring Enables Semiconductor Fabs to Improve Process Control - Vimarsana News

Picarro's New 1-ppb Class Chemical Metrology Solution for Lithography Process Tool Monitoring Enables Semiconductor Fabs to Improve Process Control

/PRNewswire/ -- Picarro Inc., a leading provider of chemical metrology systems for advanced semiconductor fabs, today announced the SLiM 100 Lithography...

Picarro, Inc.: Picarro's New 1-ppb Class Chemical Metrology Solution for Lithography Process Tool Monitoring Enables Semiconductor Fabs to Improve Process Control - Vimarsana News

Picarro, Inc.: Picarro's New 1-ppb Class Chemical Metrology Solution for Lithography Process Tool Monitoring Enables Semiconductor Fabs to Improve Process Control

SLiM 100 delivers real-time detection and quantification of VOCs to the 1 ppb level SANTA CLARA, Calif., March 14, 2023 /PRNewswire/ -- Picarro Inc., a leading provider of chemical metrology