DektakXT Stylus Profiler
Bruker Nano provides a detailed overview of the DektakXT Stylus Profiler
Source: selectscience.net
Page 2 - Materials Analysis News Today : Breaking News, Live Updates & Top Stories | Vimarsana
Stay updated with breaking news from Materials Analysis. Get real-time updates on events, politics, business, and more. Visit us for reliable news and exclusive interviews.
Top News In Materials Analysis Today - Breaking & Trending Today
Measuring surface roughness with white light interferometry
Bruker Nano discusses the use of mean roughness measurements with white light interferometry (WLI) optical profilers
Source: selectscience.net
Characterization of powdered bulk materials
ZEISS provides data on powdered bulk material characterization with light microscopy and scanning electron microscopy
Source: selectscience.net
AMETEK Appoints Jose Munoz Vice President, Operational Excellence
/PRNewswire/ -- AMETEK, Inc. (NYSE: AME) today announced the appointment of Jose Munoz as Vice President, Operational Excellence. Mr. Munoz will be responsible...
Source: prnewswire.com
Expanding the field of view in micromachining
The specialist for motion control and positioning systems, Aerotech, will be exhibiting at Photonex in Birmingham from 07 to 08 December, at NEC on stand 317. The new IFOV function for expanding the field of view during laser scanning will be demonstrated on a demo system, as well as the latest features of the Automation1 control platform.
Source: etmm-online.com