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In this interview, AZoM speaks with Petr Klímek, Product Marketing Director for TESCAN, about the TESCAN CLARA, a field-free analytical UHR SEM for nanoscale materials characterization.
Lines of shifted atoms, or dislocations, in electronic materials have long been considered detrimental due to their tendency to impede the flow of electricity. But a new $7.5 million project led by the University of Michigan will instead embrace these imperfections in next-generation electronic dev
The Verder Group announces the acquisition of Formulaction S.A. of France. As part of the group’s Scientific Division Formulaction will be integrated into Microtrac MRB, a leading manufacturer of ...
A team at the University of Michigan has now reduced the thickness of ferroelectric semiconductors to only 5 nm, or around 50 atoms, making them suitable for bridging current computers with future devices.
Guangzhou, capital of Guangdong province, has won the right to host the 2026 International Conference on Secondary Ion Mass Spectrometry (SIMS), according to a statement released by the Hong Kong University of Science and Technology (Guangzhou) on Friday.