Manufacturing Bits: May 4
Manufacturing Bits: May 4 Measuring Moon dust The National Institute of Standards and Technology (NIST) and others have developed a new way to study and measure moon dust. Using an X-ray nano computed tomography (XCT) technique, researchers measured the 3D shapes of lunar particles as small as 400nm in length. The goal is to find out how these shapes impact the optical scattering characteristics of lunar dust on the Moon. These measurements could provide more insights in terms of the Moon and its color and brightness. “This in turn might help improve tracking of weather patterns and other p...
Source: semiengineering.com