Achieving the lowest possible detection limits with ICP-OES and ICP-MS
Apr 06 2021 Read 9 Times The increasing demand for lower and lower detection limits is a major consideration for any laboratory performing trace metals analysis. The development of sophisticated instrumentation, such as ICP-OES and ICP-MS, provides the capability to achieve multielement limits of detection previously unobtainable by other atomic spectroscopy techniques. However, the analytical instrument is just one component in achieving the lowest limits of detection using plasma spectrochemistry. The other critical area that puts significant demands on a laboratory’s overall detection ca...
Source: labmate-online.com