New 800G Test Solutions Extend Testing into Optical Domain Using 60 GHz O/E Converter
New 800G Test Solutions Extend Testing into Optical Domain Using 60 GHz O/E Converter Press Release Summary: Supports de-embedding techniques on a common platform, enabling users to optimize performance margins in 800G channel designs Delivers consistent test methodologies, configurations and scripts to accelerate testing from pre-silicon to post-silicon device validation Ideal for validating transmitter and receiver electrical signaling input interfaces according to the 100Gb/s standard Original Press Release: Delivers the first 100Gb/s transmitter and receiver pre-conformance test solution ...
Source: thomasnet.com