Since its invention in the 1980s, the atomic force microscope (AFM) has become indispensable for nanoscale imaging and metrology across scientific fields. At the heart of the AFM lies a host of precision components working in unison to acquire high-resolution topological images.
Electron Microscopy for tool mark analysis has revolutionized forensic investigations, offering unparalleled precision and clarity in examining minute surface details.
By integrating an ICP instrumentation for sample atomization with mass spectrometry (MS) for precise detection, ICP-MS offers a comprehensive solution for elemental analysis in various fields of research and industry.
In a recent study published in the journal Molecules, researchers compared the potential of vibrational spectroscopic approaches for monitoring water content in natural deep eutectic solvents (NADES).