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How to Use AFM to Analyze Surface Metrology

Characterizing the surface topography of materials and devices is vital to determine their mechanical and physical properties. This article will look at the field of surface metrology and how atomic force microscopy (AFM) can benefit the analysis of complex surface features. ....

Reginald Daveyjul , Leica Microsystems , Reginald Davey , Semiconductor Atomic Force Microscopy , Further Reading , Afm For Surface Metrology , Surface Metrology ,

Surface Metrology for In-Situ Pad Monitoring

One of the most important processes in the manufacture of semiconductor hard disk and LED wafers is chemical mechanical planarization (CMP) ....

Sensofar Metrologyjun , Leem Cook , Jakubw Nalaskowsk , Mahadevaiyer Krishnan , Teo Phaik Luan , Users Group Proceedings , Mechanical Planarization , In Situ Pad Monitoring , Chemical Mechanical Planarization , Slurry Chemistry , Yin Ling , Teo Phaik , Group Proceedings , Production Engineering , Surface Metrology , Ad Monitoring , Chemical Mechanical Planarization ,

Optimizing production processes through modularization

Improved speed, precision and flexibility it is important to take advantage of every possible opportunity in optimizing production. To this end, researchers at the Fraunhofer Institute for Material and Beam Technology IWS have developed SURFinpro, a solution that uses artificial intelligence and optical measurement technology to detect, classify and visualize defects in real time, and report them to the plant carrying out the production. The experts will be presenting their system from June 27 to 30, 2023, at Laser World of Photonics, joint Fraunhofer Booth 441 in Hall A3. ....

Christopher Taudt , Fraunhofer Application Center , Surface Metrology , Zwickau Based Fraunhofer Application Center , Optical Metrology , Surface Technologies , Laser World , Production Processes , Fraunhofer Iws ,

The Critical Role of Sensors in the Metrology Industry

Advanced sensors equipped with smart computer chips, connectivity technology, and artificial intelligence are bringing the metrology industry into the twenty-first century. ....

Platform Communications , Traditional Role , Industry Focus , Open Platform Communications , Quantum Scale , Increasing Role , Metrology Automation , Surface Metrology ,

Novel 3D printer makes high-res microcomponents by photo-crosslinking...

.While optical sensing safety technology can reduce warehouse transportation accidents. ....

Rheinland Pfalz , Martin Wehner , Christian Fischmann , Miltenyi Biotec , Peter Hartmann , Christopher Taudt , Fraunhofer Sicellnet , Bartels Mikrotechnik , Fraunhofer Institute For Laser Technology , Head Of The Biofabrication Group , Fraunhofer Institute For Material , Ebeam Technology , Innovation Program , Fraunhofer Application Center , Fraunhofer Institute , Laser Technology , Biofabrication Group , Kinotex Sensor , Optical Metrology , Surface Technologies , Surface Metrology , Lean Technologies , Life Science , Aterials Processing , Uyers Guide , Press Releases ,