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Superlattice Electromechanical Characterization with Piezo-Response Force Microscopy


Sponsored by Park SystemsApr 29 2021
It is possible to generate long-range wavelength ordering known as Moiré superlattice periodicity by stacking two-dimensional (2D) materials within each other’s van der Waals interaction distance.
When this process is applied to graphene on hexagonal boron nitride (hBN), this effect would appear on the uppermost layer of graphene, causing graphene’s energy bandgap to open.
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Regulating lattice orientation between graphene and boron nitride can facilitate variation in the Moiré periodicity s wavelength, effectively tuning the graphene energy bandgap. The energy bandgap range will, in turn, affect graphene’s performance and device functionalities.
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Researchers will therefore benefit from a simple means of deciphering Moiré shape and periodicity, particularly when designing 2D graphene/BN-like heterostructured devices and materials. ....

John Paul Pineda , Jiali Zhang , Ben Schoenek , Europe Gmb , Byong Kim , Atomic Force Microscopy , Dae Yoen Won Research Development , Armando Melgarejo Research Technical Services , Park Systems Inc , Qiong Ma Department Of Physics , Boston College , Park Systems Corp , Park Systemsapr , Force Microscopy , Hexagonal Boron , Zurich Instruments , Bismuth Ferrite , Double Frequency Resonance Tracking , Image Credit , Spark Systems , Bilayer Graphene , Scientific Reports , Nature Physics , Microscopy Today , Armando Melgarejo , Research Technical Services ,

Scanning Probe Microscopy: What is it and Why is it Used


Due to the nature of light, a traditional optical microscope can be employed to attain a maximum magnification of around 800–1000x. For further magnification, scanning electron microscopes (SEMs) can be used, in this case the transmission electron microscopes (TEMs) can identify single atoms and so provide the highest magnification possible.
Considering this information, why is the scanning probe microscope (SPM) employed as yet another type of microscope? One reason is that a to-be-investigated sample in a transmission electron microscope has to be thinly sliced and so could be damaged.
The SPM technique involves imaging surface structures without ruining the sample at atomic (height) resolution. The type of imaging provided by SPM microscopes is another reason since the outcomes are shown as a type of 3D image (also in instances where only 2D information is examined). ....

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