JEOL USA introduces a new configuration of its bestselling broad ion beam milling instrument, the Cross-section Polisher (CP). The CP is widely used for preparing pristine samples prior to high resolution imaging and elemental analysis with the Scanning Electron Microscope (SEM). The upgraded configuration includes high-speed milling, sputter coating, cryo-preparation (down to LN 2 temperature) and air-isolated transfer for atmosphere sensitive specimens (for example Li batter