HELIX™ Spectral Analysis System accurately measures the highest-performance optical filters.
The HELIX Spectral Analysis System has redefined measurement capabilities of high performance thin-film optical filters. HELIX is an instrument designed and developed by Alluxa Engineering staff to address the limitations of most commercially available spectrophotometers. The system’s capabilities are four-fold: it is able to track filter edges to OD7 (-70 dB), evaluate blocking to OD9 (-90 dB), resolve edges as steep as 0.4% relative to edge wavelength from 90% transmission to OD7, and resolve passbands that are as narrow as 0.1 nm at full width half maximum (FWHM).
Figure 1. Transmission spectra of a high-cavity-count ultra-narrow bandpass filter measured with the HELIX System and compared to theory. The HELIX System is able to measure blocking up to a level of OD9 (-90 dB).
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Product Focus
Zygo’s Nexview LS650 is a large format metrology system designed as an inspection tool for automated measurement of injection molding tooling, PCBs, glass panels, and other samples requiring an extended work volume up to 650 x 650 mm. It provides 2D and 3D measurements of a variety of surface features with sub-nanometer vertical precision and sub-micron lateral precision.
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