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DDS Option for high-speed AWGs generates up to 20 sine waves

UDO Audio Super Gemini

If you thought the age of hugely ambitious polysynths was over, think again...

Wisycom Announces Updates to MTK982 Dual-Wideband Transmitter at NAMM 2024 – FOH

Wisycom MTK982 Dual-wideband Stereo IEM/IFB Transmitter – FOH

$620+ Million Arbitrary Waveform Generator Market to Grow at 8+% CAGR, Globally, by 2028 Lead by Telecommunications Segment with 26.8% Market Share by 2028, at 7.6% CAGR

NEW YORK, Oct. 28, 2022 /PRNewswire/ -- The Insight Partners published latest research study on "Arbitrary Waveform Generator Market Size, Share, Revenue, Growth Strategy, Industry Trends and

Ugandan President Yoweri Museveni while in Kenya was in possession of a DDS jammer

The device can be used to prevent detonation of bombs | Pulselive Kenya

~ajxs/Yamaha DX7 Technical Analysis

Saelig Introduces T3AWG3252 Multifunctional 16-bit Arbitrary/Function Generator With Innovative Architecture and Digital Pattern Generation

16,384 waveform entries in the sequencer Output impedance 50 Ohm and 5 Ohm selectable + / – 24V output Application tasks for which this test instrument is especially suited include the Distortion Test for Automotive Ethernet 100Base-T1 and 1000-Base-T1Power and the Semiconductor Dynamic Behavior Test, made easier with the instrument’s versatile double-pulse test capability. Among the compliance tests specified for the Automotive Ethernet standard none is more complex to set up than the transmitter distortion test. Using the T3AWG3252, as well as a Teledyne LeCroy oscilloscope and the QualiPHY Compliance Manager, testing is greatly simplified. The T3AWG3252’s excellent Harmonic Distortion performance, combined with the output voltage amplitude range and the precise tuning of the delay and phase of the differential signal pairs, makes the T3AWG3252 a perfect tool for emulating the disturber signal to assist in avoiding pitfalls encountered during the execution of the test. The T3AWG3252 can also quickly determine the dynamic behavior of power devices. The standard feature Double Pulse function required for testing MOSFETs and IGBTs is made simpler because the two pulses can have a different amplitudes, rise-times, fall-times, and widths.