Force Microscope News Today

The Asylum Research Jupiter XR Atomic Force Microscope from Oxford Instruments is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner.

Atomic force microscopy (AFM) is an effective technique for evaluating microscopic surface topography and material parameters of any specimen. AFM microscopes are available in different sizes and modes of operation, each with its advantages and limitations.

/PRNewswire/ -- Park Systems, the fastest growing manufacturer of Atomic Force Microscopes (AFM) just announced Park FX40, a groundbreaking autonomous atomic...

Sponsored by Park SystemsJan 21 2021 Ferroelectrics found extensive uses in industrial applications because of their unparalleled electromechanical and electrical characteristics, for example, as actuators, sensors and capacitors [1], [2]. The suitability of ferroelectrics for modern communication technology is currently investigated by researchers, including 5G [3] and as active layers in photovoltaics [4, 5] among other applications [6]. Ferroelectricity is the consequence of an alteration i...

Sponsored by MerckJan 21 2021 Fortuitously discovered by Japanese physicist Sumio Iijima while he was studying the surface of graphite electrodes in an electric arc discharge, Carbon nanotubes (CNTs), simply known as nanotubes, are cylindrical carbon allotrope nanostructures. 1 Since Iijima’s revelation, CNTs have retained a key role in the field of nanotechnology due to their particular electronic, mechanical, and structural properties. CNTs possess great conductivity and high aspect ratio ...