High Resolution Optics News Today

In this article, Analytik Jena explains how to analyze the presence of precious metals in electronic waste with HR ICP-OES to avoid interferences.

Alzenau, Germany – Koh Young Technology, the industry leader in True 3D measurement-based inspection solutions, will highlight an array of award-winning inspection and measurement solutions at SMTconnect in booth 4A 233 on the Nürnberg Messe event grounds during 09-11 May 2023. The following is just a glimpse into what Koh Young will have in store for our visitors at the tradeshow: