Microelectronics Using Particle News Today : Breaking News, Live Updates & Top Stories | Vimarsana

This article discusses using particle size analysis techniques to detect defects in silicon carbide (SiC), a wide-bandgap semiconductor used in microelectronic devices.

Pafnuti shutterstockNanoscale research lettersMicroelectronics using particleDefect detectionSic deviceMaterials industry focusDefect inspection techniquesAbrasive machining processesSecond editionParticle size analysis techniquesArticle analysis