Defect Detection News Today

With the development of Industry 4.0 and smart manufacturing, improving production automation, intelligence, and digitalization has become a research trend in the Wire Arc Additive Manufacturing (WAAM) field. This study introduces a digital shadow that aims to improve the adaptiveness and dimensionality of monitoring systems in WAAM. Three sensors are used in the digital shadow: a welding electric signal sensor, a camera, and a laser profilometer to collect welding current and voltage data, imag...

Arkema has won the ICIS Innovation Awards 2023 for its innovative initiative to recycle monomaterial shoes in collaboration with footwear group ON. Judges from BASF, Barentz, NNFCC, Arkema, CEFIC ...

/PRNewswire/ -- Arkema has won the ICIS Innovation Awards 2023 for its innovative initiative to recycle monomaterial shoes in collaboration with the footwear...

ZEISS VoluMax 9 titan - Powerful complete solution for efficient quality inspections

The solution leverages Ericsson Private 5G side by side with the AWS Snow Family to provide the private networks that were crucial in establishing machine learning (ML) models within the Hitachi manufacturing complex.

/PRNewswire/ -- The new ZEISS VoluMax 9 titan is compact design and powerful technology combined. The system comes with 450 kV, thus enabling reliable and...

This article discusses using particle size analysis techniques to detect defects in silicon carbide (SiC), a wide-bandgap semiconductor used in microelectronic devices.

Goodbye to fabric defects with AI fabric inspection from Pailung

/PRNewswire/ -- The "Growth Opportunities in Machine Vision in the Electronics and Semiconductor Industry" report has been added to ResearchAndMarkets.coms...

Wire Arc Additive Manufacturing (WAAM) is a promising manufacturing technology that has been used to build medium to larger-sized components. The recent progress of Artificial Intelligence (AI) technology has led to Machine Learning (ML) algorithms being widely implemented for modeling, control, monitoring, and simulation processes in WAAM. However, current defect detection systems are limited due to the types of detectable defects, and a real-time micro-defect detection system is yet to be deve...